UNIT INFORMATION
Disclaimer
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| ENS5108 | Advanced Testing | ||
| SCHOOL OF ENGINEERING | |||
| Credit Points: 15 | |||
| Prerequisites: | |||
| ENS5215 | Testing and Design for Test | ||
| Description: | |||
The unit covers the advanced techniques of testing, such as scan based testing and logic Built-In Self-Test. Analog testing techniques are introduced here, including analog boundary-scan, analog fault models and mixed-signal testing. Data converter testing (A/D and D/A) are presented as a practical application. Memory testing and memory Built-In Self-Test are introduced followed by the mixed-signal Built-In Self-Test and embedded Core Testing, based on the new standard IEEE-P1500. Full Unit Outline | |||
| Disability Standards for Education (Commonwealth 2005) | |||
| For the purposes of considering a request for Reasonable Adjustments under the Disability Standards for Education (Commonwealth 2005), inherent requirements for this subject are articulated in the Unit Description, Learning Outcomes, Graduate Attributes and Assessment Requirements of this entry. The University is dedicated to provide support to those with special requirements. Further details on the support for students with disabilities or medical conditions can be found at the Student Equity, Diversity and Disability Service website: | |||
| http://intranet.ecu.edu.au/student/support/student-equity | |||
Last Updated - Higher Education: 30/04/2009 VET: 30/04/2009