UNIT INFORMATION
Disclaimer
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| ENS5226 | VLSI Testing and Design for Test | ||
| SCHOOL OF ENGINEERING | |||
| Credit Points: 20 | |||
| Prerequisites: | |||
| ENS5121 | Digital VLSI Systems | ||
| ENS5121 | Digital VLSI Systems | ||
| Description: | |||
This unit covers the fundamentals of digital and mixed signal semiconductor testing and the Design for Test of digital and mixed-signal integrated circuits and systems. It describes the purposes of testing in the technical and economical contexts. It then presents the basic test approaches and systems such as automatic test equipment or ATE, parametric testing, functional testing and device characterisation. Fault models are then presented along with the related issue of test pattern generation. The unit also includes ad-hoc design for test and boundary-scan test for systems and boards. Full Unit Outline | |||
| Disability Standards for Education (Commonwealth 2005) | |||
| For the purposes of considering a request for Reasonable Adjustments under the Disability Standards for Education (Commonwealth 2005), inherent requirements for this subject are articulated in the Unit Description, Learning Outcomes, Graduate Attributes and Assessment Requirements of this entry. The University is dedicated to provide support to those with special requirements. Further details on the support for students with disabilities or medical conditions can be found at the Student Equity, Diversity and Disability Service website: | |||
| http://intranet.ecu.edu.au/student/support/student-equity | |||
Last Updated - Higher Education: 4/30/2009 VET: 4/30/2009